Dear Readers,
the first IF® Journal “Cranio-maxillofacial Implant Directions®” has appeared for 18 years (2006 to 2024). We see, however, that the focus of our work has expanded: We more and more correct the work of other treatment providers (dentists / orthodontists / periodontists) with the help of the tools and the methods we have developed in the last 18 years.
For this reason, the decision had been made to add two more journals to the IF® repertoire from 2024 onwards, bringing the number of journals up to three:
- CMF Cranio-maxillofacial Implant Directions®
- JUR Journal of Unwanted Results / ЖHP Журнал нежелательных результатов
- EECI Experience-Based and Evidence-Oriented Corticobasal® Implantology
Thank you for studying the articles and for the support given to all other colleagues as well as the International Implant Foundation IF®. We hope you continue to enjoy and learn from our journals in the years to come.
Munich, March 5th 2024
Prof. Dr. Antonina Ihde
Information for Authors
All relevant information for authors (manuscript requirements, submission process, intellectual property) is available here or as a PDF for download.
All-In-One-Week Curriculum
This seven-day course is held regularly by the International Implant Foundation IF® and educates participants about the benefits of the Technology of the Strategic Implant®, the modern Method of Osseofixation and Corticobasal® implants.
Location: Belgrade, Serbia
Target group: implantologists, oral surgeons, maxillofacial surgeons, dentists
Teachers: Prof. Dr. Stefan Ihde, Dr. Antonina Ihde, Prof. Dr. Vitomir Konstantinović, Prof. Dr. Olga Šipić, Dr. Aleksandar Lazarov, DT Sanela Lazinica Matković, Prof. Dr. Yan Vares
Course language: English / with professional local translation
Participants will receive a curriculum certificate. The successful participation in this curriculum is one of the prerequisites for a participation in the IF® Master of Immediate Loading program.
Further information and online registration on the All-In-One-Week Curriculum website.